Joo Ki-Nam, Kim Seung-Woo
Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea.
Opt Lett. 2007 Mar 15;32(6):647-9. doi: 10.1364/ol.32.000647.
We describe a measurement method of refractive indices by way of spectrally resolved interferometry using a femtosecond pulse laser. The method is dispersion insensitive and requires no prior precise knowledge of the geometrical thickness of the specimen. Not only the group but also the phase refractive index can be determined over the wide spectral range covered by the optical comb of the femtosecond pulse laser in use.