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Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser.

作者信息

Joo Ki-Nam, Kim Seung-Woo

机构信息

Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea.

出版信息

Opt Lett. 2007 Mar 15;32(6):647-9. doi: 10.1364/ol.32.000647.

Abstract

We describe a measurement method of refractive indices by way of spectrally resolved interferometry using a femtosecond pulse laser. The method is dispersion insensitive and requires no prior precise knowledge of the geometrical thickness of the specimen. Not only the group but also the phase refractive index can be determined over the wide spectral range covered by the optical comb of the femtosecond pulse laser in use.

摘要

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