频率梳光谱干涉测量法

Spectral Interferometry with Frequency Combs.

作者信息

Twayana Krishna, Rebolledo-Salgado Israel, Deriushkina Ekaterina, Schröder Jochen, Karlsson Magnus, Torres-Company Victor

机构信息

Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden.

Measurement Science and Technology, RISE Research Institutes of Sweden, SE-50115 Borås, Sweden.

出版信息

Micromachines (Basel). 2022 Apr 14;13(4):614. doi: 10.3390/mi13040614.

DOI:10.3390/mi13040614

PMID:35457918

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC9026469/

Abstract

In this review paper, we provide an overview of the state of the art in linear interferometric techniques using laser frequency comb sources. Diverse techniques including Fourier transform spectroscopy, linear spectral interferometry and swept-wavelength interferometry are covered in detail. The unique features brought by laser frequency comb sources are shown, and specific applications highlighted in molecular spectroscopy, optical coherence tomography and the characterization of photonic integrated devices and components. Finally, the possibilities enabled by advances in chip scale swept sources and frequency combs are discussed.

摘要

在这篇综述论文中，我们概述了使用激光频率梳源的线性干涉测量技术的发展现状。详细介绍了包括傅里叶变换光谱学、线性光谱干涉测量和扫频干涉测量在内的多种技术。展示了激光频率梳源带来的独特特性，并着重介绍了其在分子光谱学、光学相干断层扫描以及光子集成器件和组件表征方面的具体应用。最后，讨论了芯片级扫频源和频率梳的进展所带来的可能性。