van den Berg Steven A, van Eldik Sjoerd, Bhattacharya Nandini
VSL, Thijsseweg 11, 2629 JA Delft, The Netherlands.
Technische Universiteit Delft, Lorentzweg 1, 2628 CJ Delft, The Netherlands.
Sci Rep. 2015 Sep 30;5:14661. doi: 10.1038/srep14661.
Optical frequency combs have developed into powerful tools for distance metrology. In this paper we demonstrate absolute long distance measurement using a single femtosecond frequency comb laser as a multi-wavelength source. By applying a high-resolution spectrometer based on a virtually imaged phased array, the frequency comb modes are resolved spectrally to the level of an individual mode. Having the frequency comb stabilized against an atomic clock, thousands of accurately known wavelengths are available for interferometry. From the spectrally resolved output of a Michelson interferometer a distance is derived. The presented measurement method combines spectral interferometry, white light interferometry and multi-wavelength interferometry in a single scheme. Comparison with a fringe counting laser interferometer shows an agreement within <10(-8) for a distance of 50 m.
光学频率梳已发展成为距离计量的强大工具。在本文中,我们展示了使用单个飞秒频率梳激光器作为多波长源进行绝对长距离测量。通过应用基于虚拟成像相控阵的高分辨率光谱仪,频率梳模式在光谱上被分辨到单个模式的水平。使频率梳相对于原子钟稳定后,就有数千个精确已知的波长可用于干涉测量。从迈克尔逊干涉仪的光谱分辨输出中可以得出距离。所提出的测量方法在单一方案中结合了光谱干涉测量、白光干涉测量和多波长干涉测量。与条纹计数激光干涉仪的比较表明,在50米的距离上,两者的一致性在<10(-8)以内。