Electronic excitations in synthetic eumelanin aggregates probed by soft X-ray spectroscopies.
作者信息
Sangaletti L, Pagliara S, Vilmercati P, Castellarin-Cudia C, Borghetti P, Galinetto P, Gebauer R, Goldoni A
机构信息
Dipartimento di Matematica e Fisica, UniversitA Cattolica, via dei Musei 41, 25121 Brescia, Italy.
出版信息
J Phys Chem B. 2007 May 17;111(19):5372-6. doi: 10.1021/jp067415c. Epub 2007 Apr 20.
PMID:17444672
Abstract
Electronic excitations of condensed phase eumelanin aggregates are investigated with soft X-ray spectroscopies. Resonant photoemission data indicate that mechanisms of charge delocalization may occur when electrons are excited about 3 eV above the first unoccupied electronic level. An average, lower limit value of 1.6 fs was estimated for the lifetime of the excited C 1s-pi* states.
摘要
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