Suetsugu Yusuke, Kanazawa Ken-Ichi, Shibata Kyo, Shirai Mitsuru, Bondar Aleksander E, Kuzminykh Victor S, Gorbovsky Aleksander I, Sonderegger Kurt, Morii Minoru, Kawada Kakuyu
High Energy Accelerator Research Organization (KEK), Tsukuba, Ibaraki, Japan.
Rev Sci Instrum. 2007 Apr;78(4):043302. doi: 10.1063/1.2723747.
Since a comb-type rf shield was proposed in 2003 as a rf shield for future high-intensity accelerators, various types of bellow chambers and gate valves with this rf shield have been installed in the KEK B-Factory rings in series and tested with beams. Through beam tests to check the performance, a structural simplification has been tried in parallel. The temperatures of the bellow corrugations decreased by a factor of 3-6 compared to those with a conventional finger-type rf shield in most cases. The temperatures of the body of the gate valves also decreased by a factor of 2-5. These results demonstrated the availability of the comb-type rf shield. Although a discharge was observed in one simplified model, the latest model has shown no problem up to a stored beam current of 1.8 A (1.3 mA/bunch, 6 mm bunch length). Experiences with the comb-type rf shield in these four-year beam tests are reviewed here.
自2003年提出梳状射频屏蔽作为未来高强度加速器的射频屏蔽以来，各种带有这种射频屏蔽的波纹管室和闸阀已相继安装在KEK B工厂环中并进行了束流测试。通过束流测试来检查性能的同时，并行尝试了结构简化。在大多数情况下，波纹管波纹处的温度与传统指状射频屏蔽相比降低了3至6倍。闸阀阀体的温度也降低了2至5倍。这些结果证明了梳状射频屏蔽的可用性。尽管在一个简化模型中观察到了放电现象，但最新模型在存储束流为1.8 A（每束1.3 mA，束长6 mm）时未出现问题。本文回顾了这四年束流测试中梳状射频屏蔽的经验。
