Ishii Yui, Shimada Toshihiro, Okazaki Noriaki, Hasegawa Tetsuya
Department of Chemistry, The University of Tokyo, Bunkyo-ku, Tokyo 113-0033, Japan.
Langmuir. 2007 Jun 5;23(12):6864-8. doi: 10.1021/la700242w. Epub 2007 May 12.
We found a novel oscillating phenomenon associated with surface wetting during the vacuum deposition of an organic semiconductor (rubrene) on a liquid film (bis(2-ethylhexyl)sebacate, B2EHS). In-situ observations by an optical microscope revealed that the oscillation was associated with the growth of the rubrene crystals. The oscillation frequency was proportional to the evaporation rate of rubrene. On the basis of the contact angle measurements, it was concluded that the oscillation is probably due to the change in the contact angle of the liquid caused by the formation of ultrathin rubrene films on the liquid surface.
