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在高应变试样中进行会聚束电子衍射(CBED)图案动态模拟的新方法。

New approach for the dynamical simulation of CBED patterns in heavily strained specimens.

作者信息

Houdellier F, Altibelli A, Roucau C, Casanove M J

机构信息

CEMES, CNRS, Toulouse Cedex 4, France.

出版信息

Ultramicroscopy. 2008 Apr;108(5):426-32. doi: 10.1016/j.ultramic.2007.06.002. Epub 2007 Jun 12.

Abstract

A new method for the dynamical simulation of convergent beam electron diffraction (CBED) patterns is proposed. In this method, the three-dimensional stationary Schrödinger equation is replaced by a two-dimensional time-dependent equation, in which the direction of propagation of the electron beam, variable z, stands as a time. We demonstrate that this approach is particularly well-suited for the calculation of the diffracted intensities in the case of a z-dependent crystal potential. The corresponding software has been developed and implemented for simulating CBED patterns of various specimens, from perfect crystals to heavily strained cross-sectional specimens. Evidence is given for the remarkable agreement between simulated and experimental patterns.

摘要

提出了一种用于会聚束电子衍射(CBED)图案动态模拟的新方法。在该方法中,三维定态薛定谔方程被二维含时方程所取代,其中电子束的传播方向变量z充当时间。我们证明,这种方法特别适合于计算晶体势随z变化情况下的衍射强度。已经开发并实现了相应的软件,用于模拟各种样品的CBED图案,从完美晶体到严重应变的横截面样品。给出了模拟图案与实验图案之间显著吻合的证据。

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