Felten Alexandre, Bittencourt Carla, Pireaux Jean-Jacques, Reichelt Manuela, Mayer Joachim, Hernandez-Cruz Daniel, Hitchcock Adam P
LISE, University of Namur, 61 rue de Bruxelles, 5000 Namur, Belgium.
Nano Lett. 2007 Aug;7(8):2435-40. doi: 10.1021/nl071134e. Epub 2007 Jul 11.
Scanning transmission X-ray microscopy (STXM) has been used to probe the electronic structure of individual multiwall carbon nanotubes by chemical mapping at the nanoscale. Carbon 1s near-edge X-ray absorption fine structure (NEXAFS) spectra of individual structures are shown to be able to differentiate carbon nanotubes from onionlike carbon nanoparticles and to differentiate nanotubes synthesized by different growth methods. Imaging of the very same region by both STXM and transmission electron microscopy is shown to be a very useful and complementary approach.
扫描透射X射线显微镜（STXM）已被用于通过纳米尺度的化学映射来探测单个多壁碳纳米管的电子结构。单个结构的碳1s近边X射线吸收精细结构（NEXAFS）光谱能够区分碳纳米管和洋葱状碳纳米颗粒，并区分通过不同生长方法合成的纳米管。通过STXM和透射电子显微镜对同一区域进行成像被证明是一种非常有用的互补方法。
