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自下而上的痕迹强度与注意瞬脱瓶颈之间的相互关系:关联LC-NE和ST(2)模型。

A reciprocal relationship between bottom-up trace strength and the attentional blink bottleneck: relating the LC-NE and ST(2) models.

作者信息

Bowman H, Wyble B, Chennu S, Craston P

机构信息

Centre for Cognitive Neuroscience and Cognitive Systems, University of Kent, Canterbury, Kent, CT2 7NF, UK.

出版信息

Brain Res. 2008 Apr 2;1202:25-42. doi: 10.1016/j.brainres.2007.06.035. Epub 2007 Jun 30.

Abstract

There is considerable current interest in neural modeling of the attentional blink phenomenon. Two prominent models of this task are the Simultaneous Type Serial Token (ST(2)) model and the Locus Coeruleus-Norepinephrine (LC-NE) model. The former of these generates a broad spectrum of behavioral data, while the latter provides a neurophysiologically detailed account. This paper explores the relationship between these two approaches. Specifically, we consider the spectrum of empirical phenomena that the two models generate, particularly emphasizing the need to generate a reciprocal relationship between bottom-up trace strength and the blink bottleneck. Then we discuss the implications of using ST(2) token mechanisms in the LC-NE setting.

摘要

当前,人们对注意瞬脱现象的神经建模有着浓厚的兴趣。关于这项任务的两个著名模型是同步类型串行令牌(ST(2))模型和蓝斑-去甲肾上腺素(LC-NE)模型。前者生成了广泛的行为数据,而后者提供了神经生理学上的详细解释。本文探讨了这两种方法之间的关系。具体而言,我们考虑了这两个模型所产生的一系列实证现象,特别强调了在自下而上的痕迹强度和眨眼瓶颈之间建立相互关系的必要性。然后,我们讨论了在LC-NE环境中使用ST(2)令牌机制的含义。

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