用KrF准分子激光辐照的聚偏氟乙烯的拉曼光谱和红外光谱分析

Analysis of Raman and infrared spectra of poly(vinylidene fluoride) irradiated by KrF excimer laser.

作者信息

Ji Yaling, Liu Jie, Jiang Yijian, Liu Yulong

机构信息

Institute of Laser Engineering, Beijing University of Technology, Beijing 100022, People's Republic of China.

出版信息

Spectrochim Acta A Mol Biomol Spectrosc. 2008 Jul;70(2):297-300. doi: 10.1016/j.saa.2007.07.061. Epub 2007 Aug 17.

DOI:10.1016/j.saa.2007.07.061

PMID:17890141

Abstract

In this paper, the micro-mechanics of electrical conductivity increases of poly(vinylidene fluoride) (PVDF) samples induced by KrF excimer laser was analyzed by Raman spectra and infrared spectra. The irradiated layer of the samples was observed by the method of Raman mapping and scanning electron microscope and the thickness of the conducting layer of PVDF samples was determined to be about 6.5 microm. Moreover, the surface microstructure of the irradiated PVDF samples was discussed in the light of scanning electron microscope, Raman spectra and Raman mapping.

摘要

本文利用拉曼光谱和红外光谱分析了KrF准分子激光诱导聚偏氟乙烯（PVDF）样品电导率增加的微观机制。通过拉曼映射和扫描电子显微镜方法观察了样品的辐照层，并确定PVDF样品导电层的厚度约为6.5微米。此外，根据扫描电子显微镜、拉曼光谱和拉曼映射对辐照PVDF样品的表面微观结构进行了讨论。