Haruta Mitsutaka, Yoshida Kaname, Kurata Hiroki, Isoda Seiji
Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan.
Ultramicroscopy. 2008 May;108(6):545-51. doi: 10.1016/j.ultramic.2007.08.011. Epub 2007 Sep 8.
Annular dark-field (ADF) scanning transmission electron microscopy (STEM) measurements are demonstrated for the first time to be applicable for acquiring Z-contrast images of organic molecules at atomic resolution. High-angle ADF imaging by STEM is a new technique that provides incoherent high-resolution Z-contrast images for organic molecules. In the present study, low-angle ADF-STEM is successfully employed to image the molecular crystal structure of hexadecachloro-Cu-phthalocyanine (Cl16-CuPc), an organic molecule. The structures of CuPc derivatives (polyhalogenated CuPc with Br and Cl) are determined quantitatively using the same technique to determine the occupancy of halogens at each chemical site. By comparing the image contrasts of atomic columns, the occupancy of Br is found to be ca. 56% at the inner position, slightly higher than that for random substitution and in good agreement with previous TEM results.
首次证明环形暗场(ADF)扫描透射电子显微镜(STEM)测量适用于以原子分辨率获取有机分子的Z衬度图像。STEM的高角度ADF成像技术是一项新技术,可为有机分子提供非相干高分辨率Z衬度图像。在本研究中,低角度ADF-STEM成功用于对有机分子十六氯铜酞菁(Cl16-CuPc)的分子晶体结构进行成像。使用相同技术定量确定了CuPc衍生物(含Br和Cl的多卤代CuPc)的结构,以确定每个化学位点上卤素的占有率。通过比较原子列的图像对比度,发现Br在内侧位置的占有率约为56%,略高于随机取代的占有率,与之前的TEM结果吻合良好。