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单光子雪崩二极管小型化中的性能权衡

Performance trade-offs in single-photon avalanche diode miniaturization.

作者信息

Finkelstein Hod, Hsu Mark J, Zlatanovic Sanja, Esener Sadik

机构信息

Electrical and Computer Engineering Department, University of California, San Diego, 9300 Gilman Dr., M.S. 0407, La Jolla, California 92093-0407, USA.

出版信息

Rev Sci Instrum. 2007 Oct;78(10):103103. doi: 10.1063/1.2796146.

Abstract

Single-photon avalanche diodes (SPADs) provide photons' time of arrival for various applications. In recent years, attempts have been made to miniaturize SPADs in order to facilitate large-array integration and in order to reduce the dead time of the device. We investigate the benefits and drawbacks of device miniaturization by characterizing a new fast SPAD in a commercial 0.18 microm complementary metal oxide semiconductor technology. The device employs a novel and efficient guard ring, resulting in a high fill factor. Thanks to its small size, the dead time is only 5 ns, resulting in the fastest reported SPAD to date. However, the short dead time is accompanied by a high after-pulsing rate, which we show to be a limiting parameter for SPAD miniaturization. We describe a new and compact active-recharge scheme which improves signal-to-noise tenfold compared with the passive configuration, using a fraction of the area of state-of-the-art active-recharge circuits, and without increasing the dead time. The performance of compact SPADs stands to benefit such applications as high-resolution fluorescence-lifetime imaging, active-illumination three-dimensional imagers, and quantum key distribution systems.

摘要

单光子雪崩二极管(SPAD)可为各种应用提供光子到达时间。近年来,人们尝试将SPAD小型化,以利于大规模阵列集成并减少器件的死时间。我们通过对采用商用0.18微米互补金属氧化物半导体技术的新型快速SPAD进行表征,来研究器件小型化的优缺点。该器件采用了一种新颖且高效的保护环,从而具有较高的填充因子。由于其尺寸小,死时间仅为5纳秒,是迄今为止报道的最快的SPAD。然而,短死时间伴随着高后脉冲率,我们发现这是SPAD小型化的一个限制参数。我们描述了一种新型紧凑的有源充电方案,与无源配置相比,该方案将信噪比提高了十倍,使用的面积仅为现有有源充电电路的一小部分,且不增加死时间。紧凑型SPAD的性能有望惠及高分辨率荧光寿命成像、主动照明三维成像仪和量子密钥分发系统等应用。

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