Schwartz David Eric, Charbon Edoardo, Shepard Kenneth L
Bioelectronic Systems Laboratory, Department of Electrical Engineering, Columbia University, New York, NY 10027 USA (see http://www.bioee.ee.columbia.edu ).
IEEE J Solid-State Circuits. 2008 Nov 21;43(11):2546-2557. doi: 10.1109/JSSC.2008.2005818.
We describe the design, characterization, and demonstration of a fully integrated single-photon avalanche diode (SPAD) imager for use in time-resolved fluorescence imaging. The imager consists of a 64-by-64 array of active SPAD pixels and an on-chip time-to-digital converter (TDC) based on a delay-locked loop (DLL) and calibrated interpolators. The imager can perform both standard time-correlated single-photon counting (TCSPC) and an alternative gated-window detection useful for avoiding pulse pile-up when measuring bright signal levels. To illustrate the use of the imager, we present measurements of the decay lifetimes of fluorescent dyes of several types with a timing resolution of 350 ps.
我们描述了一种用于时间分辨荧光成像的全集成单光子雪崩二极管（SPAD）成像器的设计、特性表征及演示。该成像器由一个64×64的有源SPAD像素阵列和一个基于延迟锁定环（DLL）及校准插值器的片上时间数字转换器（TDC）组成。该成像器既能执行标准的时间相关单光子计数（TCSPC），也能执行一种替代的门控窗口检测，这在测量强光信号水平时有助于避免脉冲堆积。为说明该成像器的用途，我们给出了几种类型荧光染料衰减寿命的测量结果，其时间分辨率为350皮秒。
