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具有32×32 0.13微米互补金属氧化物半导体低暗计数单光子雪崩二极管阵列的实时荧光寿命成像系统。

Real-time fluorescence lifetime imaging system with a 32 x 32 0.13microm CMOS low dark-count single-photon avalanche diode array.

作者信息

Li Day-Uei, Arlt Jochen, Richardson Justin, Walker Richard, Buts Alex, Stoppa David, Charbon Edoardo, Henderson Robert

机构信息

Institute for Integrated Micro and Nano Systems, Joint Research Institute for Signal & Image Processing/Integrated Systems/Energy/Civil and Environmental Engineering, School of Engineering, University of Edinburgh, The King's Buildings, Edinburgh EH9 3JL, Scotland, UK.

出版信息

Opt Express. 2010 May 10;18(10):10257-69. doi: 10.1364/OE.18.010257.

Abstract

A compact real-time fluorescence lifetime imaging microscopy (FLIM) system based on an array of low dark count 0.13microm CMOS single-photon avalanche diodes (SPADs) is demonstrated. Fast background-insensitive fluorescence lifetime determination is achieved by use of a recently proposed algorithm called 'Integration for Extraction Method' (IEM) [J. Opt. Soc. Am. A 25, 1190 (2008)]. Here, IEM is modified for a wider resolvability range and implemented on the FPGA of the new SPAD array imager. We experimentally demonstrate that the dynamic range and accuracy of calculated lifetimes of this new camera is suitable for widefield FLIM applications by imaging a variety of test samples, including various standard fluorophores covering a lifetime range from 1.6ns to 16ns, microfluidic mixing of fluorophore solutions, and living fungal spores of Neurospora Crassa. The calculated lifetimes are in a good agreement with literature values. Real-time fluorescence lifetime imaging is also achieved, by performing parallel 32 x 16 lifetime calculations, realizing a compact and low-cost FLIM camera and promising for bigger detector arrays.

摘要

展示了一种基于低暗计数的0.13微米互补金属氧化物半导体(CMOS)单光子雪崩二极管(SPAD)阵列的紧凑型实时荧光寿命成像显微镜(FLIM)系统。通过使用一种最近提出的名为“积分提取法”(IEM)的算法[《美国光学学会志A》25,1190(2008)],实现了对背景不敏感的快速荧光寿命测定。在此,对IEM进行了修改以扩大可分辨范围,并在新型SPAD阵列成像器的现场可编程门阵列(FPGA)上实现。通过对各种测试样品进行成像,我们通过实验证明了这款新型相机计算寿命的动态范围和准确性适用于宽场FLIM应用,这些测试样品包括各种标准荧光团,其寿命范围从1.6纳秒到16纳秒、荧光团溶液的微流体混合以及粗糙脉孢菌的活真菌孢子。计算出的寿命与文献值吻合良好。通过并行进行32×16的寿命计算,还实现了实时荧光寿命成像,从而实现了一款紧凑且低成本的FLIM相机,并有望用于更大的探测器阵列。

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