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惠更斯-菲涅耳衍射原理在高深宽比SU-8微/纳米尖端阵列中的应用。

Application of Huygens-Fresnel diffraction principle for high aspect ratio SU-8 micro-/nanotip array.

作者信息

Lee Seok Woo, Lee Seung S

机构信息

Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-dong, Yuseong-gu, Daejeon, South Korea.

出版信息

Opt Lett. 2008 Jan 1;33(1):40-2. doi: 10.1364/ol.33.000040.

Abstract

A high-aspect-ratio (approximately 30) SU-8 micro-/nanotip array whose shape is defined by diffraction was fabricated by a single UV photolithography procedure and its exposed dose control. The fabrication result of the tip agrees well with the Rayleigh-Sommerfeld solution of the Huygens-Fresnel principle at wide observation distances. In a near field below distance 2 microm (only several times of wavelength), necking points also agree with the solution, although it is assumed that the distance is much larger than wavelength. It can be also applied to control the shape of the tip and to determine the critical dose D(c) of SU-8 and other photocurable polymers.

摘要

通过单次紫外光刻工艺及其曝光剂量控制,制备了一种高纵横比(约为30)、形状由衍射定义的SU-8微/纳米尖端阵列。在较宽的观察距离下,该尖端的制备结果与惠更斯-菲涅尔原理的瑞利-索末菲解吻合良好。在距离小于2微米(仅为波长的几倍)的近场中,缩颈点也与该解相符,尽管假设该距离远大于波长。它还可用于控制尖端的形状,并确定SU-8和其他光固化聚合物的临界剂量D(c)。

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