Andersson Sean B
Department of Aerospace and Mechanical Engineering, Boston University, Boston, MA 02215, USA.
IEEE Trans Nanobioscience. 2007 Dec;6(4):354-61. doi: 10.1109/tnb.2007.909014.
A high-level feedback control approach for rapid imaging in atomic force microscopy is presented. The algorithms are designed for samples which are string-like, such as biopolymers, and for boundaries. Rather than the simple raster-scan pattern, data from the microscope are used in real-time to steer the tip along the sample, drastically reducing the area to be imaged. An order-of-magnitude reduction in the time to acquire an image is possible. The technique is illustrated through simulations and through physical experiments.
提出了一种用于原子力显微镜快速成像的高级反馈控制方法。该算法针对诸如生物聚合物等线状样本以及边界进行设计。与简单的光栅扫描模式不同，显微镜的数据被实时用于引导探针沿着样本移动，从而大幅减少要成像的区域。获取图像的时间有可能减少一个数量级。通过模拟和物理实验对该技术进行了说明。
