淀粉体系的原子力显微镜分析。

Atomic force microscopy of starch systems.

机构信息

a School of Chemical Sciences , University of Auckland , Auckland , New Zealand.

出版信息

Crit Rev Food Sci Nutr. 2017 Sep 22;57(14):3127-3144. doi: 10.1080/10408398.2015.1094650.

DOI:10.1080/10408398.2015.1094650

Abstract

Atomic force microscopy (AFM) generates information on topography, adhesion, and elasticity of sample surface by touching with a tip. Under suitable experimental settings, AFM can image biopolymers of few nanometers. Starch is a major food and industrial component. AFM has been used to probe the morphology, properties, modifications, and interactions of starches from diverse botanical origins at both micro- and nano-structural levels. The structural information obtained by AFM supports the blocklet structure of the granules, and provides qualitative and quantitative basis for some physicochemical properties of diverse starch systems. It becomes evident that AFM can complement other microscopic techniques to provide novel structural insights for starch systems.

摘要

原子力显微镜（AFM）通过触针来获取样品表面形貌、附着力和弹性等信息。在合适的实验条件下，AFM 可以对几纳米的生物聚合物进行成像。淀粉是一种主要的食品和工业成分。AFM 已被用于探测来自不同植物来源的淀粉的形态、性质、修饰和相互作用，其探测范围包括微观和纳米结构水平。AFM 获得的结构信息支持颗粒的块状结构，并为不同淀粉体系的一些物理化学性质提供了定性和定量的基础。显然，AFM 可以补充其他显微镜技术，为淀粉体系提供新的结构见解。