Smadici Serban, Abbamonte Peter, Bhattacharya Anand, Zhai Xiaofang, Jiang Bin, Rusydi Andrivo, Eckstein James N, Bader Samuel D, Zuo Jian-Min
Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, IL 61801, USA.
Phys Rev Lett. 2007 Nov 9;99(19):196404. doi: 10.1103/PhysRevLett.99.196404.
We use resonant soft-x-ray scattering (RSXS) to study the electronic reconstruction at the interface between the Mott insulator LaMnO3 and the band insulator SrMnO3. Superlattices of these two insulators were shown previously to have both ferromagnetism and metallic tendencies [Koida, Phys. Rev. B 66, 144418 (2002)10.1103/PhysRevB.66.144418]. By studying a judiciously chosen superlattice reflection, we show that the interface density of states exhibits a pronounced peak at the Fermi level, similar to that predicted in related titanate superlattices by Okamoto et al. [Phys. Rev. B 70, 241104(R) (2004)10.1103/PhysRevB.70.241104]. The intensity of this peak correlates with the conductivity and magnetization, suggesting it is the driver of metallic behavior. Our study demonstrates a general strategy for using RSXS to probe the electronic properties of heterostructure interfaces.
我们使用共振软X射线散射（RSXS）来研究莫特绝缘体LaMnO₃与能带绝缘体SrMnO₃之间界面处的电子重构。先前已表明这两种绝缘体的超晶格同时具有铁磁性和金属倾向[小田，《物理评论B》66，144418（2002年）10.1103/PhysRevB.66.144418]。通过研究一个经过精心选择的超晶格反射，我们表明态密度在费米能级处呈现出一个明显的峰值，这与冈本等人在相关钛酸盐超晶格中所预测的情况类似[《物理评论B》70，241104（R）（2004年）10.1103/PhysRevB.70.241104]。这个峰值的强度与电导率和磁化强度相关，表明它是金属行为的驱动因素。我们的研究展示了一种利用RSXS探测异质结构界面电子性质的通用策略。
