IEEE Trans Med Imaging. 1982;1(3):168-73. doi: 10.1109/TMI.1982.4307568.
A detailed error analysis for the dual-sampling region-ofinterest X-ray tomography is presented. Simulation studies are used along with a range of sampling rates to quantitate the amount of sampling errors within the region of interest. It is shown that as the rate of sampling outside the region of interest becomes sparse the amount of sampling errors within the region of interest increases considerably.
本文对双采样感兴趣区 X 射线断层摄影术进行了详细的误差分析。通过模拟研究和一系列采样率,定量评估了感兴趣区内的采样误差量。结果表明,随着感兴趣区外采样率的稀疏,感兴趣区内的采样误差量会显著增加。