一种制备扁平原子力显微镜探针的简单方法。

A simple method for producing flattened atomic force microscopy tips.

作者信息

Biagioni P, Farahani J N, Mühlschlegel P, Eisler H-J, Pohl D W, Hecht B

机构信息

Nano-Optics Group, National Center of Competence for Research in Nanoscale Science, Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland.

出版信息

Rev Sci Instrum. 2008 Jan;79(1):016103. doi: 10.1063/1.2834875.

DOI:10.1063/1.2834875

PMID:18248075

Abstract

We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.

摘要

我们描述了一种简单可靠的方法，通过在由近红外超短激光脉冲照射的高数值孔径物镜焦点上扫描标准氮化硅原子力显微镜尖端，在其顶部获得一个平坦的平台。以这种方式制备的扁平尖端在安装悬臂时呈现出与基板平行的平台。它们是市售平台尖端的一种有效且经济高效的替代方案。