Bahar E, Kubik R D
Appl Opt. 1997 May 1;36(13):2956-62. doi: 10.1364/ao.36.002956.
A laboratory model of a layered structure with a rough upper surface (a glass microscope slide cut with a diamond saw) is used to obtain optical polarimetric data. Scatterometer measurements were made of all the Mueller matrix elements associated with light scattered in arbitrary directions. (A preliminary measurement of scattering from a smooth opaque gold film on a silicon wafer was used to validate the calculation of the Mueller matrix elements.) These measurements are compared with corresponding analytical solutions based on the full-wave approach. Physical interpretations of the analytical solutions that account for scattering upon reflection and transmission across rough interfaces are given in a companion paper. The agreement between calculations and measurements suggests that the full wave, polarimetric solutions can provide a reliable database for electromagnetic detection of rough surfaces in remote-sensing applications.
使用具有粗糙上表面的分层结构的实验室模型（用金刚石锯切割的玻璃显微镜载玻片）来获取光学偏振数据。对与在任意方向散射的光相关的所有穆勒矩阵元素进行散射计测量。（对硅片上光滑不透明金膜的散射进行的初步测量用于验证穆勒矩阵元素的计算。）将这些测量结果与基于全波方法的相应解析解进行比较。在一篇配套论文中给出了考虑粗糙界面反射和透射时散射的解析解的物理解释。计算结果与测量结果之间的一致性表明，全波偏振解可以为遥感应用中粗糙表面的电磁探测提供可靠的数据库。
