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Structural disorder and diffusional pathway of oxide ions in a doped Pr2NiO4-based mixed conductor.

作者信息

Yashima Masatomo, Enoki Makiko, Wakita Takahiro, Ali Roushown, Matsushita Yoshitaka, Izumi Fujio, Ishihara Tatsumi

机构信息

Department of Materials Science and Engineering, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Nagatsuta-cho 4259, Midori-Ku, Yokohama, Kanagawa 226-8502, Japan.

出版信息

J Am Chem Soc. 2008 Mar 5;130(9):2762-3. doi: 10.1021/ja711478h. Epub 2008 Feb 8.

DOI:10.1021/ja711478h
PMID:18257578
Abstract

MEM nuclear density analysis from neutron diffraction data measured in situ at 1015.6 degrees C has indicated the two-dimensional network of curved O2-O3-O2 oxide-ion diffusion paths on the (Pr,La)-O layer in a K2NiF4-type structured oxide-ionic and electronic mixed conductor (Pr0.9La0.1)2(Ni0.74Cu0.21Ga0.05)O4+delta.

摘要

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