Mielke S L, Ryan R E, Hilgeman T, Lesyna L, Madonna R G, Van Nostrand W C
Appl Opt. 1997 Nov 1;36(31):8139-44. doi: 10.1364/ao.36.008139.
A simple technique based on a Fizeau interferometer to measure the absolute phase shift on reflection for a Fabry-Perot interferometer dielectric stack mirror is described. Excellent agreement between the measured and predicted phase shift on reflection was found. Also described are the salient features of low-order Fabry-Perot interferometers and the demonstration of a near ideal low-order (1-10) Fabry-Perot interferometer through minimizing the phase dispersion on reflection of the dielectric stack. This near ideal performance of a low-order Fabry-Perot interferometer should enable several applications such as compact spectral imagers for solid and gas detection. The large free spectral range of such systems combined with an active control system will also allow simple interactive tuning of wavelength agile laser sources such as CO(2) lasers, external cavity diode lasers, and optical parametric oscillators.
描述了一种基于斐索干涉仪的简单技术，用于测量法布里-珀罗干涉仪介质堆叠镜反射时的绝对相移。发现测量的反射相移与预测的反射相移之间具有极好的一致性。还描述了低阶法布里-珀罗干涉仪的显著特征，以及通过最小化介质堆叠反射时的相位色散来演示接近理想的低阶（1-10）法布里-珀罗干涉仪。低阶法布里-珀罗干涉仪的这种接近理想的性能应能实现多种应用，例如用于固体和气体检测的紧凑型光谱成像仪。此类系统的大自由光谱范围与有源控制系统相结合，还将允许对诸如CO(2)激光器、外腔二极管激光器和光学参量振荡器等波长捷变激光源进行简单的交互式调谐。
