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Phase noise in surface-acoustic-wave filters and resonators.

作者信息

Baer R L

机构信息

Hewlett-Packard Co., Palo Alto, CA.

出版信息

IEEE Trans Ultrason Ferroelectr Freq Control. 1988;35(3):421-5. doi: 10.1109/58.20463.

DOI:10.1109/58.20463
PMID:18290168
Abstract

Measurements of the phase noise modulation imparted on UHF carriers by surface-acoustic-wave (SAW) filters and resonators have been made using an HP 3047 spectrum analyzer. Three different types of SAW phase noise were observed. One type can be explained by temperature fluctuations. It is characterized by a spectral density of phase fluctuations which decreases as 1/f(2). The predominant noise mechanism in most SAW devices has a 1/f spectral density. The source of this noise is unknown, but it appears to be associated with both acoustic propagation and transduction. In filters fabricated on lithium niobate substrates, a third noise mechanism is evidenced. This mechanism produces nonstationary noise bursts that appear to originate in the transducer region. Experiments have been carried out on substrate materials, transducer metallizations, and over acoustic path lengths. The means by which low-frequency fluctuations are mixed to the carrier frequency have been studied.

摘要

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