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层状液晶的非线性流变学

Non-linear rheology of lamellar liquid crystals.

作者信息

Lu C-Y D, Chen P, Ishii Y, Komura S, Kato T

机构信息

Department of Chemistry, National Taiwan University, 106, Taipei, Taiwan.

出版信息

Eur Phys J E Soft Matter. 2008 Jan;25(1):91-101. doi: 10.1140/epje/i2007-10267-3. Epub 2008 Feb 29.

Abstract

We measure the non-linear relation between the shear stress and shear rate in the lyotropic lamellar phase of C12E5/water system. The measured shear thinning exponent changes with the surfactant concentration. A simple rheology theory of a lamellar or smectic phase is proposed with a prediction gamma approximately sigma3/2, where gamma is the shear rate and sigma is the shear stress. We consider that the shear flow passed through the defect structure causes the main dissipation. As the defect line density varies with the shear rate, the shear thinning arises. The defect density is estimated by the dynamic balance between the production and annihilation processes. The defect production is caused by the shear-induced layer undulation instability. The annihilation occurs through the shear-induced defect collision process. Further flow visualization experiment shows that the defect texture correlates strongly with the shear thinning exponent.

摘要

我们测量了C12E5/水体系溶致层状相中的剪切应力与剪切速率之间的非线性关系。测得的剪切变稀指数随表面活性剂浓度而变化。提出了一种层状或近晶相的简单流变学理论,预测γ约为σ3/2,其中γ为剪切速率,σ为剪切应力。我们认为,通过缺陷结构的剪切流会导致主要的能量耗散。由于缺陷线密度随剪切速率而变化,所以出现了剪切变稀现象。缺陷密度是通过产生和湮灭过程之间的动态平衡来估计的。缺陷的产生是由剪切诱导的层起伏不稳定性引起的。湮灭是通过剪切诱导的缺陷碰撞过程发生的。进一步的流动可视化实验表明,缺陷织构与剪切变稀指数密切相关。

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