Bruno Carlo, Marcaccio Massimo, Paolucci Demis, Castellarin-Cudia Carla, Goldoni Andrea, Streletskii Alexey V, Drewello Thomas, Barison Simona, Venturini Alessandro, Zerbetto Francesco, Paolucci Francesco
INSTM, Section of Bologna, Dipartimento di Chimica G. Ciamician, Alma Mater Studiorum, Università di Bologna Via Selmi 2, 40126 Bologna, Italy.
J Am Chem Soc. 2008 Mar 26;130(12):3788-96. doi: 10.1021/ja0733179. Epub 2008 Mar 4.
The formidable electron-acceptor properties of C60 contrast with its difficult oxidations. Only recently it has become possible to achieve reversibility of more than one electrochemical anodic process versus the six reversible cathodic reductions. Here we exploit the reactivity of electrochemical oxidations of pure C60 to grow a film of high thermal and mechanical stability on the anode. The new material differs remarkably from its precursor since it conducts both electrons and holes. Its growth and properties are consistently characterized by a host of techniques that include atomic force microscopy (AFM), Raman and infrared spectroscopies, X-ray-photoelectron spectroscopy (XPS), secondary-ion mass spectrometry (SIMS), scanning electron microscopy and energy-dispersive X-ray analysis (SEM-EDX), matrix-assisted laser desorption/ionization (MALDI), and a variety of electrochemical measurements.
C60强大的电子受体特性与其难以被氧化形成了鲜明对比。直到最近,相对于六个可逆的阴极还原反应,实现不止一个电化学阳极过程的可逆性才成为可能。在此,我们利用纯C60电化学氧化的反应活性,在阳极上生长出具有高热稳定性和机械稳定性的薄膜。这种新材料与其前驱体有显著不同,因为它既能传导电子也能传导空穴。其生长过程和特性通过一系列技术进行了持续表征,这些技术包括原子力显微镜(AFM)、拉曼光谱和红外光谱、X射线光电子能谱(XPS)、二次离子质谱(SIMS)、扫描电子显微镜和能量色散X射线分析(SEM-EDX)、基质辅助激光解吸/电离(MALDI)以及各种电化学测量。