余辉模式和应用于电子回旋共振离子源的新型微脉冲束模式。

Afterglow mode and the new micropulsed beam mode applied to an electron cyclotron resonance ion source.

作者信息

Maunoury L, Adoui L, Grandin J P, Noury F, Huber B A, Lamour E, Prigent C, Rozet J P, Vernhet D, Leherissier P, Pacquet J Y

机构信息

CIRIL, Bd Henri Becquerel, BP 5133, Caen Cedex 05, France.

出版信息

Rev Sci Instrum. 2008 Feb;79(2 Pt 2):02A313. doi: 10.1063/1.2812340.

DOI:10.1063/1.2812340

PMID:18315103

Abstract

An increasing number of experiments in the field of low energy ion physics (<25 keV/charge) requires pulsed beams of highly charged ions. Whereas for high-intensity beams (greater than microampere) a pulsed beam chopper, installed downstream to the analyzing dipole, is used. For low-intensity beams (<100 nA) the ion intensity delivered during the pulse may be increased by operating the electron cyclotron resonance discharge in the afterglow mode. This method gives satisfactory results (i.e., average current during the beam pulse is higher than the current in the cw mode) for high charge state ions. In this paper, we report on results of the afterglow mode for beams of (22)Ne(q+), (36)Ar(q+), and (84)Kr(q+) ions. Furthermore, a new promising "micropulsed beam" mode will be described with encouraging preliminary results for (84)Kr(27+) and (36)Ar(17+) ions.

摘要

在低能离子物理领域（能量小于25keV/电荷），越来越多的实验需要高电荷态离子的脉冲束。对于高强度束流（大于微安），会在分析偶极下游安装一个脉冲束斩波器来使用。对于低强度束流（小于100nA），可以通过在余辉模式下操作电子回旋共振放电来提高脉冲期间的离子强度。对于高电荷态离子，这种方法能得到令人满意的结果（即束脉冲期间的平均电流高于连续波模式下的电流）。在本文中，我们报告了（22）Ne（q+）、（36）Ar（q+）和（84）Kr（q+）离子束的余辉模式结果。此外，还将描述一种新的有前景的“微脉冲束”模式，并给出（84）Kr（27+）和（36）Ar（17+）离子令人鼓舞的初步结果。