Suzuki T, Kobayashi K, Sasaki O
Faculty of Engineering, Niigata University, 8050 Ikarashi 2, Niigata 950-2181, Japan.
Appl Opt. 2000 Jun 1;39(16):2646-52. doi: 10.1364/ao.39.002646.
A two-wavelength interferometer that uses two separate modulating currents with different phases but the same frequencies to detect a greater degree of object displacement in real time is proposed and demonstrated. The measurement error was 57 nm, roughly 1/80 of the synthetic wavelength. We have confirmed that this modulating technique enables us to equip our prototype interferometer with a simple feedback-control system that eliminates external disturbance.