Wang Z L
Department of Physics, Arizona State University, Tempe 85287-1504.
J Electron Microsc Tech. 1991 Feb;17(2):231-40. doi: 10.1002/jemt.1060170210.
Reflection electron microscopy (REM) is applied to image the structure of polished natural diamond (001) surfaces (of 5 x 4 mm size) after friction experiments under a pressure below the critical value. Friction tracks marked by a diamond needle after a single pass movement under a pressure of 13 GPa can be seen in REM images and show non-uniform contrast. The surface shows relatively dark image contrast at the light contacted area, which is possibly due to the structural modification at the top atomic layer. The high local contacting pressure pushes part of the needle into the surface which causes fracture, resulting in the formation of grooves at the surface. It is possible to have plastic deformation in this process, but no evidence has been found for the presence of cracking. The observations support the adhesion frictional mechanism rather than the micro-cleavage model.
反射电子显微镜（REM）用于对在低于临界值的压力下进行摩擦实验后的抛光天然金刚石（001）表面（尺寸为5×4毫米）的结构进行成像。在13吉帕压力下单程移动后由金刚石针标记的摩擦痕迹在REM图像中可见，并显示出不均匀的对比度。在光接触区域表面显示出相对较暗的图像对比度，这可能是由于顶部原子层的结构改变所致。高局部接触压力将针的一部分压入表面，导致断裂，从而在表面形成凹槽。在此过程中可能发生塑性变形，但未发现开裂的证据。这些观察结果支持粘着摩擦机制而非微裂纹模型。
