Klement U, da Silva M, Skrotzki W
Department of Materials and Manufacturing Technology, Chalmers University of Technology, SE-412 96 Göteborg, Sweden.
J Microsc. 2008 Jun;230(Pt 3):455-63. doi: 10.1111/j.1365-2818.2008.02005.x.
The scanning electron microscopy-based electron backscatter diffraction technique has been used to determine grain orientations of abnormally grown grains upon annealing in nanocrystalline Ni and Ni-20 at.% Fe electrodeposits. The results show that in nanocrystalline Ni and Ni-Fe, the first grown grains that can be detected are 411 oriented with respect to the normal direction (411//ND). Upon annealing, further grain growth occurs and the dominant orientation of the abnormally growing grains changes from 411//ND to 111//ND. Twinning is found to be the mechanism responsible for the orientation change and is for the first time described in connection with abnormal grain growth in nanocrystalline materials. This means that well-known models for the formation of annealing twins (initially introduced in connection with recrystallization) also seem to apply in nanocrystalline materials.
基于扫描电子显微镜的电子背散射衍射技术已被用于确定纳米晶镍和含20原子%铁的镍电沉积物退火时异常生长晶粒的取向。结果表明，在纳米晶镍和镍铁中，首次检测到的生长晶粒相对于法线方向为411取向（411//ND）。退火时，会发生进一步的晶粒生长，异常生长晶粒的主导取向从411//ND变为111//ND。孪晶被发现是导致取向变化的机制，并且首次与纳米晶材料中的异常晶粒生长相关联进行了描述。这意味着，众所周知的退火孪晶形成模型（最初是与再结晶相关引入的）似乎也适用于纳米晶材料。
