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A simple technique for the estimation of the voltage of a transmission electron microscope.

作者信息

Rao Duggi V Sridhara

出版信息

J Electron Microsc (Tokyo). 2008 Aug;57(4):119-22. doi: 10.1093/jmicro/dfn009. Epub 2008 Jun 2.

DOI:10.1093/jmicro/dfn009
PMID:18519583
Abstract

A convergent beam electron diffraction (CBED) technique has been described for the determination of the voltage of a transmission electron microscope (TEM). It involves observing the intersections of HOLZ lines, (1 3 13), (3 1 13), (10 10 8) and (10 10 8), in the transmitted disc of the CBED pattern obtained along the [37 37 4] zone axis of silicon. It is suitable for the TEMs with operational voltage in the range of 200 kV, and is also free from the tilt limitations.

摘要

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