Ishikawa Michio, Katsura Makoto, Nakashima Satoru, Aizawa Kento, Inoue Tsutomu, Okamura Hidekazu, Ikemoto Yuka
Department of Earth and Space Science, Graduate School of Science, Osaka University, 1-1 Machikaneyama, Toyonaka, Osaka, 560-0043, Japan.
Opt Express. 2011 Jun 20;19(13):12469-79. doi: 10.1364/OE.19.012469.
In order to obtain broadband near-field infrared (IR) spectra, a Fourier-transform IR spectrometer (FT-IR) and a ceramic light source were used with a scattering-type scanning near-field optical microscope (s-SNOM). To suppress the background (far-field) scattering, the distance between the scattering probe and the sample was modulated with frequency Ω by a piezo-electric actuator, and the Ω component was extracted from the signal with a lock-in detection. With Ω=30 kHz, a peak-to-peak modulation amplitude of 198 nm, and a probe with smooth surface near the tip, broadband near-field IR spectra could be obtained in the 1200-2500 cm(-1).
为了获得宽带近场红外（IR）光谱，将傅里叶变换红外光谱仪（FT-IR）和陶瓷光源与散射型扫描近场光学显微镜（s-SNOM）一起使用。为了抑制背景（远场）散射，通过压电致动器以频率Ω调制散射探针与样品之间的距离，并通过锁定检测从信号中提取Ω分量。当Ω = 30 kHz，峰峰值调制幅度为198 nm，且尖端附近表面光滑的探针时，可在1200 - 2500 cm⁻¹范围内获得宽带近场红外光谱。
