Lee Ji Hye, Choi Mi Ri, Jo William, Jang Ji Young, Kim Mi Young
Department of Physics, Ewha Womans University, Seoul 120-750, Republic of Korea.
Ultramicroscopy. 2008 Sep;108(10):1106-9. doi: 10.1016/j.ultramic.2008.04.020. Epub 2008 May 7.
Coating of 0.65Pb(Mg(1/3)Nb(2/3))O(3)-0.35PbTiO(3) (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO(3) (SRO) metallic oxide electrodes on SrTiO(3) (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.
通过溶胶-凝胶法对0.65Pb(Mg(1/3)Nb(2/3))O(3)-0.35PbTiO(3)（PMN-PT）弛豫铁电体进行涂层，随后通过脉冲激光沉积在SrTiO(3)（STO）单晶衬底上生长外延SrRuO(3)（SRO）金属氧化物电极。通过控制操作参数，成功制备了具有择优生长取向的高质量SRO上的PMN-PT薄膜。利用X射线衍射（XRD）、透射电子显微镜（TEM）和原子力显微镜（AFM）研究了SRO/STO衬底上弛豫铁电PMN-PT薄膜的结构特性。确认了异质结构的面内和面外取向，并且还揭示了材料的结构孪晶。
