Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides.

Coating of 0.65Pb(Mg(1/3)Nb(2/3))O(3)-0.35PbTiO(3) (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO(3) (SRO) metallic oxide electrodes on SrTiO(3) (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.