Kim Ki Woo, Choi Seung Jun, Moon Tae Wha
National Instrumentation Center for Environmental Management, Seoul National University, Seoul 151-921, Republic of Korea.
Micron. 2008 Dec;39(8):1160-5. doi: 10.1016/j.micron.2008.05.007. Epub 2008 May 28.
Charging artifacts and surface features of corn starch granules were investigated by scanning electron microscopy. Three types of industrial waxy corn starch granules with different levels of moisture content (0, 10.3, and 24.2%) were prepared and subjected to both secondary electron imaging and backscattered electron imaging. There were no significant charging artifacts in secondary electron images at 3 or 5 kV. However, imaging at higher magnifications and accelerating voltages much lower than 3 kV ranging from 0.1 to 1 kV did not show well-resolved structures. At higher accelerating voltages than 5 kV, charging was manifested as excessive brightness at specific areas and alteration of bright and dark lines in the direction of the raster pattern in secondary electron images of all the types of specimens tested. As the accelerating voltage increased up to 30 kV in secondary electron images, the charging also increased. Meanwhile, no charging was detected in all the backscattered electron images taken at different accelerating voltages. As the accelerating voltage increased in backscattered electron images, the resolution increased with less depth of focus. Consistent results were found in all the types of corn starch granules assayed in this study. These results suggest that a simple and rapid morphological analysis of moisturized starches can be performed by backscattered electron imaging without considerable heat drying of starches. Concomitantly, it allows for imposing a higher accelerating voltage to ensure better image resolution, facilitating morphological characterization of diverse starch granules as they are in native states.
通过扫描电子显微镜研究了玉米淀粉颗粒的充电伪像和表面特征。制备了三种不同水分含量(0%、10.3%和24.2%)的工业糯玉米淀粉颗粒,并对其进行了二次电子成像和背散射电子成像。在3 kV或5 kV下的二次电子图像中没有明显的充电伪像。然而,在高于3 kV的更高放大倍数和远低于3 kV(范围为0.1至1 kV)的加速电压下成像时,结构分辨率不佳。在高于5 kV的加速电压下,充电表现为所有测试类型标本的二次电子图像中特定区域的过度亮度以及光栅图案方向上明暗线的改变。在二次电子图像中,随着加速电压增加到30 kV,充电现象也增加。同时,在不同加速电压下拍摄的所有背散射电子图像中均未检测到充电现象。在背散射电子图像中,随着加速电压增加,分辨率提高,但焦深减小。在本研究中分析的所有类型的玉米淀粉颗粒中均发现了一致的结果。这些结果表明,可以通过背散射电子成像对湿润淀粉进行简单快速的形态分析,而无需对淀粉进行大量加热干燥。同时,它允许施加更高的加速电压以确保更好的图像分辨率,便于对处于天然状态的各种淀粉颗粒进行形态表征。