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一种用于估计硬X射线弯曲多层光学元件像差的分析方法:1. 焦散形状的推导

An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes.

作者信息

Guigay J-P, Morawe Ch, Mocella V, Ferrero C

机构信息

ESRF, BP 220, 6, rue Jules Horowitz, F-38043 Grenoble cedex, France.

出版信息

Opt Express. 2008 Aug 4;16(16):12050-9. doi: 10.1364/oe.16.012050.

DOI:10.1364/oe.16.012050
PMID:18679478
Abstract

An analytical approach has been developed to derive aberration effects in parabolic and elliptic multilayer optics with weak interaction between photons and matter. The method is based on geometrical ray tracing including refraction effects up to the first order of the refractive index decrement delta. In the parabolic case, the derivation leads to simple parametric equations for the caustic shape. In the elliptic case, the analytical results more involved, but can be well approximated by the parabolic solution. Both geometries are compared with regard to the fundamental impact on their focusing properties.

摘要

已开发出一种分析方法,用于推导光子与物质间相互作用较弱的抛物线形和椭圆形多层光学器件中的像差效应。该方法基于几何光线追迹,包括折射率减量δ一阶以内的折射效应。在抛物线形的情况下,推导得出了关于焦散形状的简单参数方程。在椭圆形的情况下,分析结果更为复杂,但可用抛物线形的解很好地近似。比较了这两种几何形状对其聚焦特性的基本影响。

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