An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of caustic shapes.

An analytical approach has been developed to derive aberration effects in parabolic and elliptic multilayer optics with weak interaction between photons and matter. The method is based on geometrical ray tracing including refraction effects up to the first order of the refractive index decrement delta. In the parabolic case, the derivation leads to simple parametric equations for the caustic shape. In the elliptic case, the analytical results more involved, but can be well approximated by the parabolic solution. Both geometries are compared with regard to the fundamental impact on their focusing properties.