Fabre Nathalie, Lalouat Loïc, Cluzel Benoit, Mélique Xavier, Lippens Didier, de Fornel Frédérique, Vanbésien Olivier
Institut d'Electronique, de Microélectronique et de Nanotechnologie (IEMN), UMR CNRS 8520, Université des Sciences et Technologies de Lille, Cité Scientifique, BP 60069, F-59652 Villeneuve d'Ascq Cedex, France.
Phys Rev Lett. 2008 Aug 15;101(7):073901. doi: 10.1103/PhysRevLett.101.073901. Epub 2008 Aug 11.
We report here the direct observation by using a scanning near-field microscopy technique of the light focusing through a photonic crystal flat lens designed and fabricated to operate at optical frequencies. The lens is fabricated using a III-V semiconductor slab, and we directly visualize the propagation of the electromagnetic waves by using a scanning near-field optical microscope. We directly evidence spatially, as well as spectrally, the focusing operating regime of the lens. At last, in light of the experimental scanning near-field optical microscope pictures, we discuss the lens ability to focus light at a subwavelength scale.
我们在此报告，利用扫描近场显微镜技术直接观察了光通过一个设计并制造用于光频操作的光子晶体平板透镜的聚焦情况。该透镜是使用III-V族半导体平板制造的，并且我们通过使用扫描近场光学显微镜直接可视化了电磁波的传播。我们在空间以及光谱上直接证明了该透镜的聚焦工作状态。最后，根据实验性扫描近场光学显微镜图像，我们讨论了该透镜在亚波长尺度聚焦光的能力。
