Dorset D L, Zhang W P
Electron Diffraction Department, Medical Foundation of Buffalo, Inc., New York 14203.
J Electron Microsc Tech. 1991 Jun;18(2):142-7. doi: 10.1002/jemt.1060180208.
The crystal structure of the odd-chain paraffin, n-tritriacontane, nC33H68, is determined directly by using low-dose electron microscope images and electron diffraction intensity data from epitaxially grown microcrystals. Phases of the most intense "polyethylene" reflections are determined from triplet structure-invariant relationships often used in X-ray crystallography. Low-dose electron microscopic images provide phases of the low-angle "lamellar" reflections and these can be used with one-dimensional structure-invariant relationships to determine other phases on the 00l reciprocal row. The phase set is sufficient to calculate an electrostatic potential map which is directly interpretable as a structure image at atomic resolution.
通过使用低剂量电子显微镜图像和外延生长微晶的电子衍射强度数据，直接确定了奇数链石蜡正三十三烷（(nC_{33}H_{68})）的晶体结构。最强烈的“聚乙烯”反射的相位是根据X射线晶体学中常用的三重结构不变关系确定的。低剂量电子显微镜图像提供了低角度“层状”反射的相位，这些相位可与一维结构不变关系一起用于确定(00l)倒易行上的其他相位。该相位集足以计算出一个静电势图，该图可直接解释为原子分辨率下的结构图像。
