Dougherty J P, Preli F R, Michel R G
Department of Chemistry, University of Connecticut, Storrs, CT 06268, U.S.A.
Talanta. 1989 Jan-Feb;36(1-2):151-9. doi: 10.1016/0039-9140(89)80090-6.
A pulsed excimer-pumped dye laser was used to excite atomic flourescence in graphite tube electrothermal atomizer. A 60-Hz ac magnitude field was applied around the atomizer and parallel to the excitation beam, for Zeeman background correction. The correction system was found to degrade the detection limits for silver, cobalt, indium, manganese, lead, and thallium by a factor of between 1 and 10. An increase in magnetic field strength, or a decrease in laser linewidth, should improve the detection limits, but was not possible here. For copper, the application of Zeeman background correction was unsuccessfull because the instrumentation was unable to resolve the sigma components from the laser emission profile sufficiently during the background correction measurement. For elements that exhibit sufficient Zeeman splitting, the linear dynamic range was the same with or without background correction Zeeman background correction was used to correct for scatter, in the resonance flourescence determination of manganese in a zinc chloride matrix and in mouse brain tissue.
使用脉冲准分子泵浦染料激光器在石墨管电热原子化器中激发原子荧光。在原子化器周围施加一个60赫兹的交流磁场，且该磁场与激发光束平行，用于塞曼背景校正。结果发现，该校正系统会使银、钴、铟、锰、铅和铊的检测限降低1至10倍。增加磁场强度或减小激光线宽应能提高检测限，但在此处无法实现。对于铜，塞曼背景校正未成功，因为仪器在背景校正测量期间无法充分分辨激光发射轮廓中的σ分量。对于表现出足够塞曼分裂的元素，有无背景校正时线性动态范围相同。在氯化锌基质和小鼠脑组织中锰的共振荧光测定中，使用塞曼背景校正来校正散射。
