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使用多毛细管X射线光学器件和位置敏感探测器的X射线光谱法。

X-ray spectrometry using polycapillary X-ray optics and position sensitive detector.

作者信息

Ding X, Xie J, He Y, Pan Q, Yan Y

机构信息

Institute of Low Energy Nuclear Physics, Beijing Radiation Center, Beijing Normal University, Beijing 100875, PR China.

出版信息

Talanta. 2000 Oct 2;53(1):17-22. doi: 10.1016/s0039-9140(00)00387-8.

DOI:10.1016/s0039-9140(00)00387-8
PMID:18968083
Abstract

Polycapillary X-ray optics (capillary X-ray lens) are now popular in X-ray fluorescence (XRF) analysis. Such an X-ray lens can collect X-rays emitted from an X-ray source in a large solid angle and form a very intense X-ray microbeam which is very convenient for microbeam X-ray fluorescence (MXRF) analysis giving low minimum detection limits (MDLs) in energy dispersive X-ray fluorescence (EDXRF). A new method called position sensitive X-ray spectrometry (PSXS) which combines an X-ray lens used to form an intense XRF source and a position sensitive detector (PSD) used for wavelength dispersive spectrometry (WDS) measurement was developed recently in the X-ray Optics Laboratory of Institute of Low Energy Nuclear Physics (ILENP) at Beijing Normal University. Such a method can give high energy and spacial resolution and high detection efficiency simultaneously. A short view of development of both the EDXRF using a capillary X-ray lens and the new PSXS is given in this paper.

摘要

多毛细管X射线光学元件(毛细管X射线透镜)目前在X射线荧光(XRF)分析中很受欢迎。这种X射线透镜可以在大立体角内收集从X射线源发射的X射线,并形成非常强的X射线微束,这对于微束X射线荧光(MXRF)分析非常方便,在能量色散X射线荧光(EDXRF)中能给出很低的最低检测限(MDL)。最近,北京师范大学低能核物理研究所(ILENP)的X射线光学实验室开发了一种新方法,称为位置敏感X射线光谱法(PSXS),它结合了用于形成强XRF源的X射线透镜和用于波长色散光谱法(WDS)测量的位置敏感探测器(PSD)。这种方法可以同时提供高能量和空间分辨率以及高检测效率。本文简要介绍了使用毛细管X射线透镜的EDXRF和新的PSXS的发展情况。

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