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基于高分辨率绝缘体上硅阵列波导光栅的倾斜光纤布拉格光栅传感器询问系统。

Tilted fiber Bragg grating sensor interrogation system using a high-resolution silicon-on-insulator arrayed waveguide grating.

作者信息

Cheben Pavel, Post Edith, Janz Siegfried, Albert Jacques, Laronche Albane, Schmid Jens H, Xu Dan-Xia, Lamontagne Boris, Lapointe Jean, Delâge André, Densmore Adam

机构信息

Institute for Microstructural Sciences, National Research Council Canada, Ottawa, Ontario, Canada.

出版信息

Opt Lett. 2008 Nov 15;33(22):2647-9. doi: 10.1364/ol.33.002647.

Abstract

We report a compact high-resolution arrayed waveguide grating (AWG) interrogator system designed to measure the relative wavelength spacing between two individual resonances of a tilted fiber Bragg grating (TFBG) refractometer. The TFBG refractometer benefits from an internal wavelength and power reference provided by the core mode reflection resonance that can be used to determine cladding mode perturbations with high accuracy. The AWG interrogator is a planar waveguide device fabricated on a silicon-on-insulator platform, having 50 channels with a 0.18 nm wavelength separation and a footprint of 8 mmx8 mm. By overlaying two adjacent interference orders of the AWG we demonstrate simultaneous monitoring of two widely separated resonances in real time with high wavelength resolution. The standard deviation of the measured wavelength shifts is 1.2 pm, and it is limited by the resolution of the optical spectrum analyzer used for the interrogator calibration measurements.

摘要

我们报道了一种紧凑型高分辨率阵列波导光栅(AWG)询问器系统,该系统旨在测量倾斜光纤布拉格光栅(TFBG)折射仪两个单独谐振之间的相对波长间距。TFBG折射仪受益于由芯模反射谐振提供的内部波长和功率参考,可用于高精度确定包层模扰动。AWG询问器是一种在绝缘体上硅平台上制造的平面波导器件,具有50个通道,波长间隔为0.18 nm,占地面积为8 mm×8 mm。通过叠加AWG的两个相邻干涉级次,我们展示了以高波长分辨率实时同时监测两个相距很远的谐振。测量的波长偏移的标准偏差为1.2 pm,并且它受到用于询问器校准测量的光谱分析仪分辨率的限制。

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