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一种基于像素的似然框架,用于分析光漂白后荧光恢复数据。

A pixel-based likelihood framework for analysis of fluorescence recovery after photobleaching data.

作者信息

Jonasson J K, Lorén N, Olofsson P, Nydén M, Rudemo M

机构信息

Mathematical Sciences, Chalmers University of Technology and Gothenburg University, Göteborg, Sweden.

出版信息

J Microsc. 2008 Nov;232(2):260-9. doi: 10.1111/j.1365-2818.2008.02097.x.

Abstract

A new framework for the estimation of diffusion coefficients from data on fluorescence recovery after photobleaching (FRAP) with confocal laser scanning microscopy (CLSM) is presented. It is a pixel-based statistical methodology that efficiently utilizes all information about the diffusion process in the available set of images. The likelihood function for a series of images is maximized which gives both an estimate of the diffusion coefficient and a corresponding error. This framework opens up possibilities (1) to obtain localized diffusion coefficient estimates in both homogeneous and heterogeneous materials, (2) to account for time differences between the registrations at the pixels within each image, and (3) to plan experiments optimized with respect to the number of replications, the number of bleached regions for each replicate, pixel size, the number of pixels, the number of images in each series etc. To demonstrate the use of the new framework, we have applied it to a simple system with polyethylene glycol (PEG) and water where we find good agreement with diffusion coefficient estimates from NMR diffusometry. In this experiment, it is also shown that the effect of the point spread function is negligible, and we find fluorochrome-concentration levels that give a linear response function for the fluorescence intensity.

摘要

本文提出了一种新的框架,用于通过共聚焦激光扫描显微镜(CLSM)对光漂白后荧光恢复(FRAP)数据进行扩散系数估计。这是一种基于像素的统计方法,能够有效利用可用图像集中有关扩散过程的所有信息。通过最大化一系列图像的似然函数,可同时得到扩散系数的估计值及其相应误差。该框架提供了以下可能性:(1)在均质和非均质材料中获得局部扩散系数估计值;(2)考虑每个图像内像素记录之间的时间差异;(3)针对重复次数、每次重复的漂白区域数量、像素大小、像素数量、每个系列的图像数量等因素规划优化实验。为了演示新框架的使用,我们将其应用于聚乙二醇(PEG)和水的简单系统,发现与核磁共振扩散测量法得到的扩散系数估计值吻合良好。在该实验中,还表明点扩散函数的影响可忽略不计,并且我们找到了能给出荧光强度线性响应函数的荧光染料浓度水平。

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