Pacella D, Mazon D, Romano A, Malard P, Pizzicaroli G
Associazione Euratom-ENEA sulla Fusione, Centro Ricerche Frascati, Via E. Fermi, 45-00044 Frascati, Rome, Italy.
Rev Sci Instrum. 2008 Oct;79(10):10E322. doi: 10.1063/1.2965782.
A new technique has been especially developed for determining the detection efficiency of the silicon surface barrier diodes used for tomography reconstructions at Tore Supra, as function of the energy of the x-ray photons, in the range of 4-25 keV. The response of these diodes has been studied for different bias voltages (0-120 V), with a portable x-ray electronic tube and a cooled Si-p-i-n diode, working in photon counting mode, for the absolute calibration.
已经专门开发了一种新技术，用于确定在托雷·苏普拉（Tore Supra）用于断层扫描重建的硅表面势垒二极管的探测效率，该效率是4至25 keV范围内X射线光子能量的函数。使用便携式X射线电子管和冷却的硅PIN二极管，在光子计数模式下工作，对这些二极管在不同偏置电压（0至120 V）下的响应进行了研究，以进行绝对校准。
