Stavale F, Niehus H, Achete C A
Divisão de Metrologia de Materiais, Inmetro, CEP 25250-020, Xerém, Duque de Caxias, Rio de Janeiro, Brazil.
Rev Sci Instrum. 2008 Oct;79(10):105102. doi: 10.1063/1.2992477.
An uncomplicated quartz microbalance device has been developed which is transferable into ultrahigh vacuum (UHV) systems. The device is extremely useful for flux calibration of different kinds of material evaporators. Mounted on a commercial specimen holder, the device allows fast quartz microbalance transfer into the UHV and subsequent positioning exactly to the sample location where subsequent thin film deposition experiments shall be carried out. After backtransfer into an UHV sample stage, the manipulator may be loaded in situ with the specimen suited for the experiment. The microbalance device capability is demonstrated for monolayer and submonolayer vanadium depositions with an achieved calibration sensitivity of less the 0.001 ML coverage.
