DeMasi A, Piper L F J, Zhang Y, Reid I, Wang S, Smith K E, Downes J E, Peltekis N, McGuinness C, Matsuura A
Department of Physics, Boston University, Boston, Massachussets 02215, USA.
J Chem Phys. 2008 Dec 14;129(22):224705. doi: 10.1063/1.3030975.
The element-specific electronic structure of the organic semiconductor aluminum tris-8-hydroxyquinoline (Alq(3)) has been studied using a combination of resonant x-ray emission spectroscopy, x-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and density functional theory (DFT) calculations. Resonant and nonresonant x-ray emission spectroscopy were used to measure directly the carbon, nitrogen and oxygen 2p partial densities of states in Alq(3), and good agreement was found with the results of DFT calculations. Furthermore, resonant x-ray emission at the carbon K-edge is shown to be able to measure the partial density of states associated with individual C sites. Finally, comparison of previous x-ray emission studies and the present data reveal the presence of clear photon-induced damage in the former.
利用共振X射线发射光谱、X射线光电子能谱、X射线吸收光谱和密度泛函理论(DFT)计算相结合的方法,研究了有机半导体三(8-羟基喹啉)铝(Alq(3))的元素特异性电子结构。共振和非共振X射线发射光谱被用于直接测量Alq(3)中碳、氮和氧的2p态密度分布,结果与DFT计算结果吻合良好。此外,碳K边的共振X射线发射能够测量与单个C位点相关的态密度分布。最后,将之前的X射线发射研究与当前数据进行比较,发现前者存在明显的光子诱导损伤。