对具有17个Y染色体短串联重复序列（Y-STR）位点的父子对中的突变进行分析。
Analysis of mutations in father-son pairs with 17 Y-STR loci.
作者信息
Decker Amy E, Kline Margaret C, Redman Janette W, Reid Thomas M, Butler John M
机构信息
Biochemical Science Division, National Institute of Sciences and Technology, Gaithersburg, MD 20899-8311, USA.
出版信息
Forensic Sci Int Genet. 2008 Jun;2(3):e31-5. doi: 10.1016/j.fsigen.2007.08.016. Epub 2007 Nov 1.
We have examined 389 father/son sample pairs from U.S. Caucasians, African Americans, Hispanics and Asians using the 17 Y-STR loci in the Yfilertrade mark kit and observed a total of 24 differences between father and son. Thirteen mutations resulted in the gain of a repeat in the son and 11 resulted in a loss of a repeat. All samples resulted in single repeat mutations except one sample which contained a two repeat loss at Y-GATA-H4. Furthermore, two different sample pairs were found to have two mutations. An African American sample pair had a mutation at DYS458 and a second at DYS635 and an Asian sample pair had mutations at DYS439 and Y-GATA-H4.
我们使用Yfiler商标试剂盒中的17个Y染色体短串联重复序列（Y-STR）位点，对389对来自美国白种人、非裔美国人、西班牙裔和亚裔的父子样本进行了检测，共观察到父子之间存在24处差异。其中13处突变导致儿子的重复序列增加，11处导致重复序列减少。除了一个在Y-GATA-H4位点出现两个重复序列缺失的样本外，所有样本均产生单个重复序列突变。此外，还发现有两对不同的样本存在两处突变。一对非裔美国人样本在DYS458和DYS635位点发生突变，一对亚裔样本在DYS439和Y-GATA-H4位点发生突变。
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