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应力诱导的硅酸镓镧厚度模式谐振器中的频率偏移。

Stress-induced frequency shifts in langasite thickness-mode resonators.

作者信息

Kosinski John A, Pastore Robert R, Yang Xiaomeng, Yang Jiashi, Turner Joseph A

机构信息

US Army Communication and Electronics Command, Fort Monmouth, NJ, USA.

出版信息

IEEE Trans Ultrason Ferroelectr Freq Control. 2009 Jan;56(1):129-35. doi: 10.1109/TUFFC.2009.1012.

DOI:10.1109/TUFFC.2009.1012
PMID:19213639
Abstract

In this paper, we report on our study of stress-induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles phi and theta. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on phi and theta is calculated and examined, and loci of stress-compensation are determined.

摘要

在本文中，我们报告了关于应力对硅酸镧镓钇板厚度振动影响的研究。假设该板为双旋转板，由角度φ和θ确定。假设应力是均匀且平面的。使用了Tiersten针对谐振器频率偏移所推导的一阶微扰积分。计算并研究了频率偏移对φ和θ的依赖性，并确定了应力补偿轨迹。

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