Thin films of photoactive polymer blends.

The morphology inside photoactive blended films of two conjugated homopolymers poly [(1-methoxy)-4-(2-ethylhexyloxy)-p-phenylene-vinylene] (MEH-PPV) and poly(3-hexylthiophene-2,5-diyl) (P3HT) is investigated. For both homopolymers a linear dependence of the installed film thickness from the concentration of the polymer solution used in spin coating is probed. This dependence allows preparation of an efficient series of blended films with constant thickness and different blending ratios. Information about the lateral structure inside the films is gained from grazing incidence small angle X-ray scattering. At the calculated critical blending ratio the smallest lateral separation between adjacent domains is found representing the highest surface contact between both homopolymers in the films. The presence of wetting layers at both interfaces as detected with X-ray reflectivity and atomic force microscopy is promising for photovoltaic applications. UV/Vis spectroscopy complements the structural investigation.