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磷L(2,3)边X射线吸收近边结构:参考化合物概述。

Phosphorus L(2,3)-edge XANES: overview of reference compounds.

作者信息

Kruse Jens, Leinweber Peter, Eckhardt Kai Uwe, Godlinski Frauke, Hu Yongfeng, Zuin Lucia

机构信息

University of Rostock, Institute for Land Use, 18059 Rostock, Germany.

出版信息

J Synchrotron Radiat. 2009 Mar;16(Pt 2):247-59. doi: 10.1107/S0909049509000211. Epub 2009 Jan 16.

Abstract

Synchrotron-based X-ray absorption near-edge structure (XANES) spectroscopy is becoming an increasingly used tool for the element speciation in complex samples. For phosphorus (P) almost all XANES measurements have been carried out at the K-edge. The small number of distinctive features at the P K-edge makes in some cases the identification of different P forms difficult or impossible. As indicated by a few previous studies, the P L(2,3)-edge spectra were richer in spectral features than those of the P K-edge. However, experimentally consistent spectra of a wide range of reference compounds have not been published so far. In this study a library of spectral features is presented for a number of mineral P, organic P and P-bearing minerals for fingerprinting identification. Furthermore, the effect of radiation damage is shown for three compounds and measures are proposed to reduce it. The spectra library provided lays a basis for the identification of individual P forms in samples of unknown composition for a variety of scientific areas.

摘要

基于同步加速器的X射线吸收近边结构(XANES)光谱正日益成为用于分析复杂样品中元素形态的工具。对于磷(P),几乎所有的XANES测量都是在K边进行的。P K边的独特特征较少,这使得在某些情况下难以或无法识别不同的P形态。正如之前的一些研究所表明的,P L(2,3)边光谱的特征比P K边光谱更丰富。然而,目前尚未发表一系列参考化合物的实验一致光谱。在本研究中,给出了一系列矿物P、有机P和含P矿物的光谱特征库,用于指纹识别。此外,还展示了三种化合物的辐射损伤效应,并提出了降低辐射损伤的措施。所提供的光谱库为识别各种科学领域中未知成分样品中的单个P形态奠定了基础。

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