Cao Meng, Zhang Hai-Bo, Li Chao, Nishi Ryuji
Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.
Rev Sci Instrum. 2009 Feb;80(2):026104. doi: 10.1063/1.3077940.
We have investigated the effect of a sample structure on reconstruction quality in computed tomography (CT). A power spectrum with respect to a projection angle is used to represent the sample structure. The condition for high quality reconstruction is then analyzed with the simulation and the electron tomography experiment based on an ultrahigh voltage electron microscope. The truncated terms in the power spectrum are suggested to be less than 10(-3) for high quality reconstruction. The effect of the sample structure is believed to be an important factor for high quality reconstruction of complex samples in various CT techniques.
我们研究了样品结构对计算机断层扫描（CT）重建质量的影响。使用相对于投影角度的功率谱来表示样品结构。然后通过基于超高压电子显微镜的模拟和电子断层扫描实验分析高质量重建的条件。对于高质量重建，建议功率谱中的截断项小于10^(-3)。样品结构的影响被认为是各种CT技术中复杂样品高质量重建的一个重要因素。
