De la Torre Ibarra Manuel H, Ruiz Pablo D, Huntley Jonathan M
Centro de Investigaciones en Optica Asociación Civil, Loma Del Bosque, León Guanajuato CP, Mexico.
Opt Lett. 2009 Mar 15;34(6):806-8. doi: 10.1364/ol.34.000806.
The use of phase-contrast spectral optical coherence tomography to measure two orthogonal displacement components on a slice within a scattering medium is demonstrated. This is achieved by combining sequential oblique illumination of the object and recording two interferograms before plus two after the deformation. The proposed technique is illustrated with results from a sample undergoing simple shear. Depth-resolved out-of-plane and in-plane sensitivities of 0.14 and 4.2 microm per fringe are demonstrated up to a depth of 400 microm in a water-based polymer.
本文展示了利用相衬光谱光学相干断层扫描技术测量散射介质中某一薄片上两个正交位移分量的方法。这是通过对物体进行连续斜向照明,并在变形前后分别记录两幅干涉图来实现的。通过对一个经历简单剪切的样本进行实验,验证了所提出的技术。在一种水基聚合物中,深度分辨的面外和面内灵敏度分别为每条纹0.14微米和4.2微米,测量深度可达400微米。